•연구자: 물리학과 오홍석
•발표일: 2023.1
•DOI:https://doi.org/10.1021/acs.cgd.2c00959
•Hongseok Oh et al., Crystal Growth & Design (Q1); 2023
•Abstract
In this study, synchrotron radiation X-ray diffraction analysis is used to investigate the initial growth dynamics of metal–organic vapor-phase epitaxy-grown ZnO nanorods on c-Al2O3 substrates. A two-dimensional area detector with a grazing-incidence geometry enables projected reciprocal space mapping (RSM) using coordinate transformation of diffraction images. The projected RSM reveals multiple heteroepitaxial relationships between ZnO and Al2O3, including the dominant relationship of ZnO(101̅0)∥Al2O3(21̅1̅0). Evolution of internal strain is revealed by an additional study on diffraction images and θ–2θ scans. Surface topology from atomic force microscopy estimates the growth rate, supported by the Scherrer equation analysis of the θ–2θ diffraction.